Study of leaf rust resistance gene in wheat line 19HRWSN-76
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    Abstract:

    Leaf rust causes yield losses in wheat crops worldwide. Wheat line 19HRWSN-76 was resistant to most tested Puccinia triticina races. To identify the resistance gene 19HRWSN-76 was crossed with the leaf rust susceptible wheat line Zhengzhou 5389. A single dominant gene for resistance was identified in segregating F2 population from this cross and tentatively designated LrHR76. The resistance gene initially located on chromosome 3DL based on the SSR marker barc71. The genetic distance between LrHR76 and barc71 is 3.0 cM.

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History
  • Received:July 09,2015
  • Revised:September 17,2015
  • Adopted:March 22,2016
  • Online: July 07,2016
  • Published:
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